International Journal of
Innovation, Management and Technology

Editor-In-Chief: Prof. Jin Wang
Frequency: Semi-annual
ISSN: 2010-0248 (Print)
E-mali: editor@ijimt.org
OPEN ACCESS

IJIET 2026 Vol.17(2): 12-28
doi: 10.18178/ijimt.2026.17.2.982

Breaking down Techno-stress: Insights and a Strategic Agenda for Future Research

Mehmood Ahmad1 , Mehak Mahajan2,*

  • 1Department of Commerce, University of Jammu, Jammu, India
  • 2Mittal School of Business, Lovely Professional University, Jalandhar, India

* Corresponding author

  • Manuscript receivedJune 3, 2026
  • acceptedJuly 6, 2026
  • publishedSeptember 29, 2026

Abstract

This study systematically reviews techno-stress research published between 2007 and 2024 using the Scientific Procedures and Rationales for Systematic Literature Reviews (SPAR-4-SLR) protocol, analyzing 91 Scopus-indexed and Australian Business Deans Council (ABDC)-listed journal articles through descriptive and bibliometric techniques. The findings reveal a sharp rise in research after 2019, identify the dominant theoretical foundations and four major thematic streams, and highlight a strong focus on the negative consequences of techno-stress while positive adaptation mechanisms remain underexplored. The review also uncovers theoretical, methodological, and geographical gaps, particularly regarding artificial intelligence, cross-cultural contexts, and sustainable digital well-being, providing an integrated understanding of the field and a comprehensive agenda for future research.

Keywords

  • techno-stress
  • bibliometric analysis
  • Scientific Procedures and Rationales for Systematic Literature Reviews (SPAR-4-SLR)
  • digital well-being
  • workplace stress
  • digital transformation
IJIMT-V17N2-982

How to Cite

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Mehmood Ahmad and Mehak Mahajan, "Breaking down Techno-stress: Insights and a Strategic Agenda for Future Research," International Journal of Innovation, Management and Technology, vol. 17, no. 2, pp. 12-28, 2026. https://doi.org/10.18178/ijimt.2026.17.2.982

Copyright & License

Copyright © 2026 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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